 Professor Ayten KUNTMAN Biography - Professor Ayten Kuntman received her B.Sc./M.Sc. degrees from Istanbul University and Ph.D. degree from Istanbul Technical University in 1979 and 1989, respectively. In 1980, she joined the Electronics and Communication Engineering Department of Istanbul Technical University. In 1995, she joined Electrical and Electronics Engineering Department of Istanbul University. Since 2001, she is a professor of electrical engineering in the same department (retired February 2017). Her research interest includes Dielectric Properties of Polymers, Semiconductors, Microelectronics Technologies, Cable Polymers, Anisotropic Etching, Thermodynamic Properties of Polymers, Aging and Reliability of Electrical and Semiconductor Materials. Dr. Kuntman has authored many publications published in indexed international journals on the above mentioned research fields. Furthermore she advised and completed the work of 5 Ph.D. students and 14 M.Sc. students. She supervised and completed 14 projects supported by the Research Foundation of Istanbul University. Dr. Kuntman acted as Editor in Chief of IU-JEEE from 2009 to 2017. |
Ayten KUNTMAN Istanbul University-Cerrahpasa, Faculty of Engineering 34320 Avcilar, Istanbul, Turkey akuntman@istanbul.edu.tr H. Hakan KUNTMAN Istanbul Technical University Department of Electronics and Communication Engineering Faculty of Electrical and Electronics Engineering 34469 Maslak, Istanbul, Turkey kuntman@itu.edu.tr Abstract – Since modern CMOS technologies are continuously scaling down, the analog circuit designers are faced to serious reliability problems in their designs. These problems are caused by physical effects such as hot carrier injection, negative and positive bias temperature instability (N/PBTI) and temperature dependent dielectric breakdown (TDDB). Therefore, it is an important factor for a robust design to estimate the deviations caused by these degradation mechanisms. Although digital signal processing is becoming increasingly more powerful and many types of signal processing have indeed moved to digital domain due to the advances in IC technology, analog circuits are stil fundamentally necessary in many complex and high performance systems. This is caused by the reality that naturally occurring signals are analog. That means, analog circuits act as a bridge between the real world and digital systems. In analog signal processing, many circuit topologies including active filters, oscillators, immittance simulators etc. have been proposed in the literature which find a large application area, ranging from very low frequencies at several Hz levels to RF applications operating at GHz level; in other words, from biomedical and sonar signals to cognitive radio and encrypted communications. Several works have been performed on these degradation effects in MOS structures and appeared in the literature. Generally, physical models were proposed and used in most of the reliability studies. But, difficulties in preparation of physical models seem to be the most important disadvantages of these type models. As a result, statistical method based observation of experimental results have been introduced in some works to overcome these disadvantages of physical models. This talk deals with statistical methods for modelling of the degradation caused deviations in the drain current and threshold voltage of the NMOS and PMOS transistors. Using the observation results obtained, the effect of degradation was investigated statistically and new statistical methods were introduced to be an alternative to those given in the literature. The statistical models introduced are independent of the realization technology, exhibiting short simulation time and high accuracy. The accuracy is proven on circuit design examples. |
 Professor H. Hakan KUNTMAN Biography - Professor H. Hakan Kuntman received his B.Sc., M.Sc. and Ph.D. degrees from Istanbul Technical University in 1974, 1977 and 1982, respectively. In 1974, he joined the Electronics and Communication Engineering Department of Istanbul Technical University. Since 1993, he is a professor of electronics in the same department (retired, April 2016). His research interest includes design of electronic circuits, modeling of electron devices and electronic systems, active filters, design of analog IC topologies. Dr. Kuntman has authored many publications on modelling and simulation of electron devices and electronic circuits for computer-aided design, analog VLSI design and active circuit design. He is the author or the co-author of 129 journal papers published or accepted for publishing in international journals, 185 conference papers presented or accepted for presentation in international conferences, 161 Turkish conference papers presented in national conferences and 10 books related to the above mentioned areas. He advised and completed the work of 16 Ph.D. students and 44 M.Sc students. Dr. Kuntman is a member of the Chamber of Turkish Electrical Engineers (EMO). From 2001 to 2004 he acted as the Head of the Electronics and Communication Engineering Department, from 2004 to 2010 he was the Dean of Electrical & Electronics Engineering Faculty of Istanbul Technical University, he is retired professor since April 2016. Furthermore, Dr. Kuntman is one of the founders of the ELECO conferences and acted as the Conference Chairman several times. |
